Press Release

Spectral Reflectometer for Film Thickness Measurement Carrollton, Texas, October 2016 – Verity Instruments, Inc. is pleased to announce the availability of the SP2100 Spectral Reflectometer designed for film thickness measurement for in-situ and in-line applications. The SP2100 includes a high performance spectrometer and Xenon flashlamp. The spectrometer includes a two-dimensional, thermoelectrically cooled CCD array that…

For Immediate Release Verity Instruments Releases New Value Line Spectrometer September 2, 2016– Verity Instruments is pleased to announce the release of the SE1024GL- CMOS spectrometer. The SE1024GL- CMOS spectrometer provides a cost effective solution for general purpose applications. As compared the SD1024GL, cost is reduced by the use of simpler packaging, LCD display removal,…